2019 IEEE International Integrated Reliability Workshop (IIRW)

Source: https://www.usnews.com/news/best-countries/articles/2018-03-20/the-us-military-wants-to-lead-the-innovation-game-in-vr

Source: https://www.usnews.com/news/best-countries/articles/2018-03-20/the-us-military-wants-to-lead-the-innovation-game-in-vr

Event Date: 
October 13, 2019 to October 17, 2019
Source: 
IEEE Reliability Society
Location: 
South Lake Tahoe, CA

The IEEE IIRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identifying the defects and physical mechanisms responsible for reliability problems.

Topics include resistive memories; high-k and nitrided SiO2 gate dielectrics; reliability assessment of novel devices; III-V; SOI; emerging memory technologies; transistor reliability, including hot carriers and NBTI/PBTI; root cause defects (physical mechanisms and simulations); Cu interconnects and low-k dielectrics; impact of transistor degradation on circuit reliability; MEMS and sensor reliability; designing-in reliability (products, circuits, systems, and processes); customer product reliability requirements/manufacturer reliability tasks; wafer level reliability tests (test approaches and reliability test structures); reliability modeling and simulation; optoelectronics; and single event upsets.

Communities: