Kristen Donnell is an assistant professor in the Department of Electrical and Computer Engineering at Missouri University of Science and Technology (Missouri S&T) and a member of the research team at the Applied Microwave Nondestructive Testing Laboratory. Her current research interests include frequency selective surfaces, materials characterization, embedded sensing, thermography, and microwave and millimeter-wave imaging. Previously, she worked as a systems engineer and electric engineer at Raytheon. Dr. Donnell holds a B.S.E.E. from Colorado State University, an M.S.E.E. from the University of Missouri-Rolla, and a Ph.D. in electrical engineering from Missouri S&T. She is also a senior member of IEEE and is involved with the IEEE Instrumentation and Measurement Society.