Kristen Donnell

Kristen Donnell is an assistant professor in the Department of Electrical and Computer Engineering at Missouri University of Science and Technology (Missouri S&T) and a member of the research team at the Applied Microwave Nondestructive Testing Laboratory. Her current research interests include frequency selective surfaces, materials characterization, embedded sensing, thermography, and microwave and millimeter-wave imaging. Previously, she worked as a systems engineer and electric engineer at Raytheon. Dr. Donnell holds a B.S.E.E. from Colorado State University, an M.S.E.E. from the University of Missouri-Rolla, and a Ph.D. in electrical engineering from Missouri S&T. She is also a senior member of IEEE and is involved with the IEEE Instrumentation and Measurement Society.

The appearance of an author or a presenter on this DTIC website should not necessarily be construed as association of this individual with the United States Department of Defense (DoD), and the views, information, or opinions expressed herein are those of the author or presenter and do not necessarily constitute endorsement by the United States Department of Defense (DoD).